Comparison of hydrophobic modifying layers on SiO 2 studied with a force-controlled atomic force microscope

Author: Jarvis S.P.   Pethica J.B.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.273, Iss.1, 1996-02, pp. : 284-288

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Abstract