Resolution of an optical image of a scanning near-field optical/atomic force microscope as a function of sample-probe distance during synchronized irradiation

Author： Chiba N.   Muramatsu H.   Nakajima K.   Homma K.   Ataka T.   Fujihira M.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.273, Iss.1, 1996-02, pp. : 331-334

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