Investigation of photoelectrical properties and carrier transport in porous silicon structures by the transient grating technique

Author: Mizeikis V.   Subacius L.   Grigoras K.   Simkiene I.   Jarasinas K.   Sdzius M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.276, Iss.1, 1996-04, pp. : 191-194

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Abstract