Transmission electron microscopy characterisation of ion beam synthesised FeSi 2 layers

Author: Tavares J.   Bender H.   Maex K.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.277, Iss.1, 1996-05, pp. : 90-97

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract