Adsorption of alkyl-trichlorosilanes on glass and silicon: A comparative study using sum-frequency spectroscopy and XPS

Author： Lobau J.   Wolfrum K.   Romphorst A.   Galla K.   Seeger S.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.289, Iss.1, 1996-11, pp. : 272-281

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

A study on structures and formation mechanisms of self-assembled monolayers of n-alkyltrichlorosilanes using infrared spectroscopy and atomic force microscopy

By Iimura K.-i.   Nakajima Y.   Kato T.  

Thin Solid Films, Vol. 379, Iss. 1, 2000-12 ,pp. : 230-239

Elsevier

Access to resources Recommend Favorite

Sum-frequency vibrational spectroscopy of oxygen-ion and oxygen-radical treated poly(ethylene terephthalate) and oxide/poly(ethylene terephthalate) interface

By Miyamae T.   Yamada Y.   Uyama H.   Nozoye H.  

Vacuum, Vol. 66, Iss. 3, 2002-08 ,pp. : 305-310

Elsevier

Access to resources Recommend Favorite

XPS and ellipsometric study of DLC/silicon interface

By Zajckova L.   Veltruska K.   Tsud N.   Franta D.  

Vacuum, Vol. 61, Iss. 2, 2001-05 ,pp. : 269-273

Elsevier

Access to resources Recommend Favorite

XPS and AFM study of chemical mechanical polishing of silicon nitride

By Yang G.-R.   Zhao Y.-P.   Hu Y.Z.   Paul Chow T.   Gutmann R.J.  

Thin Solid Films, Vol. 333, Iss. 1, 1998-11 ,pp. : 219-223

Elsevier

Access to resources Recommend Favorite

Silver‐capped silicon nanopillar platforms for adsorption studies of folic acid using surface enhanced Raman spectroscopy and density functional theory

By  

JOURNAL OF RAMAN SPECTROSCOPY, Vol. 46, Iss. 11, 2015-11 ,pp. : 1087-1094

John Wiley & Sons Inc

Access to resources Recommend Favorite