Author: Tamada M. Koshikawa H. Omichi H.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.293, Iss.1, 1997-01, pp. : 113-116
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Atomic scale characterization of semiconductors by in-situ real time spectroscopic ellipsometry
Thin Solid Films, Vol. 318, Iss. 1, 1998-04 ,pp. :
Oxidative polymerization of N‐vinylcarbazole in polymer matrix
POLYMER INTERNATIONAL, Vol. 50, Iss. 6, 2001-06 ,pp. :