Defect-free strain relaxation in locally MBE-grown SiGe heterostructures

Author： Eisele I. Rupp T. Kaesen F. Hansch W. Hammerl E. Gravesteijn D.J. Schorer R. Silveira E. Abstreiter G.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.294, Iss.1, 1997-02, pp. : 27-32

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