2D Numerical simulation of a-Si:H TFTS: Application to parasitic contact resistances evaluation

Author: Martin S.   Rolland A.   Mottet S.   Szydlo N.   Lebrun H.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.296, Iss.1, 1997-03, pp. : 129-132

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Abstract