Author: Stojanovic M. Osmokrovic P. Boreli F. Novkovic D. Webb R.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.296, Iss.1, 1997-03, pp. : 181-183
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Large area X-ray detectors based on amorphous silicon technology
By Moy J.-P.
Thin Solid Films, Vol. 337, Iss. 1, 1999-01 ,pp. :
By Zairi S. Martelet C. Jaffrezic-Renault N. M'gaeth R. Maaref H. Lamartine R.
Thin Solid Films, Vol. 383, Iss. 1, 2001-02 ,pp. :
Large area microcrystalline silicon films grown by ECR-CVD
By Ferrero S. Mandracci P. Cicero G. Giorgis F. Pirri C.F. Barucca G.
Thin Solid Films, Vol. 383, Iss. 1, 2001-02 ,pp. :