Author： Ozanam F. Chazalviel J.-N. Wehrspohn R.B.
Publisher： Elsevier
ISSN： 0040-6090
Source： Thin Solid Films, Vol.297, Iss.1, 1997-04, pp. : 53-60
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
In situ photoluminescence characterization of porous silicon formation
By Chi N. Phillips D.L. Chan K.-Y.
Thin Solid Films, Vol. 342, Iss. 1, 1999-03 ,pp. :
Access to resources
Recommend
An in-situ method of monitoring the surface area of porous silicon
By Peter L.M. Riley D.J. Wielgosz R.I.
Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. :
Electrochemistry and photoluminescence of porous amorphous silicon
By Wehrspohn R.B. Chazalviel J.-N. Ozanam F. Solomon I.
Thin Solid Films, Vol. 297, Iss. 1, 1997-04 ,pp. :
Stability of electroluminescence and photoluminescence of porous silicon
By Kozlowski F. Wiedenhofer A. Wagenseil W. Steiner P. Lang W.
Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. :