FMR, XRD and XHRTEM characterization of stresses in an epitaxial Ni-Cu film prepared on MgO(001) by d.c. biased plasma sputter deposition

Author: Maruyama H.   Qiu H.   Hashimoto M.   Fudaba K.   Nakai H.   Barna A.   Barna P.B.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.299, Iss.1, 1997-05, pp. : 59-62

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Abstract