Analysis of light emitting diodes by X-ray reflectivity measurements

Author: Christ T.   Geffart F.   Glusen B.   Kettner A.   Lussem G.   Schafer O.   Stumpflen V.   Wendorff J.H.   Tsukruk V.V.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.302, Iss.1, 1997-06, pp. : 214-222

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Abstract