Structural characterization of self-assembled quantum dot structures by X-ray diffraction techniques

Author： Darhuber A.A.   Stangl J.   Holy V.   Bauer G.   Krost A.   Grundmann M.   Bimberg D.   Ustinov V.M.   Kop'ev P.S.   Kosogov A.O.   Werner P.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.306, Iss.2, 1997-09, pp. : 198-204

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