Ultrahigh vacuum atomic layer epitaxy of Cd 1-x Mn x Te layers grown on ZnTe/GaAs (100) substrates: Reflection mass spectrometry studies

Author: Sadowski J.T.   Herman M.A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.306, Iss.2, 1997-09, pp. : 266-270

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Abstract