Control of the YSZ biaxial alignment on polycrystalline Ni-Cr substrates by ion beam selective resputtering

Author: Mao Y.J.   Jiang B.Y.   Ren C.X.   Zhang F.   Liu X.H.   Zou S.C.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.312, Iss.1, 1998-01, pp. : 27-31

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Abstract