SEM and XPS studies of titanium dioxide thin films grown by MOCVD

Author: Babelon P.   Dequiedt A.S.   Mostefa-Sba H.   Bourgeois S.   Sibillot P.   Sacilotti M.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.322, Iss.1, 1998-06, pp. : 63-67

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Abstract