Surface characterization of oriented silver films on Si (100) substrates using scanning tunnelling microscopy

Author： Ali A.O. Kshirsagar R.B. Dharmadhikari C.V.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.323, Iss.1, 1998-06, pp. : 105-109

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