Author: Ortega-Vinuesa J.L. Tengvall P. Lundstrom I.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.324, Iss.1, 1998-07, pp. : 257-273
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Multiscale modelling of molecular monolayers adsorbed on silicon
Applied Physics A, Vol. 86, Iss. 3, 2007-03 ,pp. :
Electric measurements by AFM on silicon nanocrystals
By Decossas S. Mazen F. Baron T. Souifi A. Bremond G.
Physica E, Vol. 17, Iss. unknown, 2003-04 ,pp. :