Thermal reliability of n-GaAs/Ti/Pt/Au Schottky contacts with thin Ti films for reduced gate resistance

Author： Sehgal B.K.   Bhattacharya B.   Vinayak S.   Gulati R.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.330, Iss.2, 1998-09, pp. : 146-149

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