Depth profiling of non-conductive oxidic multilayers with plasma-based SNMS in HF-mode

Author： Goschnick J.   Natzeck C.   Sommer M.   Zudock F.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.332, Iss.1, 1998-11, pp. : 215-219

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Detection in the ppm range and high-resolution depth profiling with the new SNMS instrument INA-X

By Jorzick J.  

Applied Physics A, Vol. 78, Iss. 5, 2004-03 ,pp. : 655-658

Springer Publishing Company

Access to resources Recommend Favorite

Non-ablative capillary z-pinch for plasma-based waveguide

By Kaiser J.   Liška M.   Samek O.   Egri T.   Ritucci A.   Reale A.   Tomassetti G.   Reale L.   Palladino L.   Kukhlevsky S.   Flora F.   Mezi L.   Faenov A.   Pikuz T.  

Czechoslovak Journal of Physics, Vol. 55, Iss. 1, 2005-01 ,pp. : 35-44

Springer Publishing Company

Access to resources Recommend Favorite

Non-ablative capillary z-pinch for plasma-based waveguide

By Kaiser J.   Liška M.   Samek O.   Egri T.   Ritucci A.   Reale A.   Tomassetti G.   Reale L.   Palladino L.   Kukhlevsky S.   Flora F.   Mezi L.   Faenov A.   Pikuz T.  

Czechoslovak Journal of Physics, Vol. 50, Iss. 18, 2005-01 ,pp. : 35-44

Springer Publishing Company

Access to resources Recommend Favorite

Micro Electro Discharge Machining of Non-Conductive Ceramic

By  

Materials Science Forum, Vol. 2018, Iss. 911, 2018-02 ,pp. : 20-27

Trans Tech Publications

Access to resources Recommend Favorite

Quantitative depth profiling of Al 3 Hf phase formed by Hf ions implantation into aluminum

By Miao W.   Tao K.   Liu X.   Li B.   Liu B.  

Vacuum, Vol. 69, Iss. 4, 2003-01 ,pp. : 467-472

Elsevier

Access to resources Recommend Favorite