Characterization of epitaxially grown Cu/Nb multilayer on -Al 2 O 3 with RBS/channeling technique

Author: Yamamoto S.   Naramoto H.   Tuchiya B.   Narumi K.   Aoki Y.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.335, Iss.1, 1998-11, pp. : 85-89

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Abstract