Annealing of CaF 2 adlayers grown on Si(111): investigations of the morphology by atomic force microscopy

Author: Wollschlager J.   Pietsch H.   Kayser R.   Klust A.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.336, Iss.1, 1998-12, pp. : 120-123

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Abstract