AFM characterization of the structure of Au-colloid monolayers and their chemical etching

Author: Doron A.   Joselevich E.   Schlittner A.   Willner I.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.340, Iss.1, 1999-02, pp. : 183-188

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Abstract