Formation of CuInSe 2 by the annealing of stacked elemental layers-analysis by in situ high-energy powder diffraction

By Brummer A.   Honkimaki V.   Berwian P.   Probst V.   Palm J.   Hock R.  

Thin Solid Films, Vol. 437, Iss. 1, 2003-08 ,pp. : 297-307

Elsevier

Access to resources Recommend Favorite

Co‐evaporation process study of Cu2ZnSnSe4 thin films by in situ light scattering and in situ X‐ray diffraction

By  

PHYSICA STATUS SOLIDI (A) APPLICATIONS AND MATERIALS SCIENCE, Vol. 212, Iss. 2, 2015-02 ,pp. : 356-363

John Wiley & Sons Inc

Access to resources Recommend Favorite

High pressure and high temperature in situ X-ray diffraction studies in the Paris-Edinburgh cell using a laboratory X-ray source^†

By Toulemonde Pierre   Goujon Céline   Laversenne Laetitia   Bordet Pierre   Bruyère Rémy   Legendre Murielle   Leynaud Olivier   Prat Alain   Mezouar Mohamed  

International Journal of High Pressure Research, Vol. 34, Iss. 2, 2014-04 ,pp. : 167-175

Taylor & Francis Ltd

Access to resources Recommend Favorite

Development of the Compact Furnace for the In Situ Observation under Ultra-High Temperature by Synchrotron x-Ray Surface Diffraction

By  

Materials Science Forum, Vol. 2016, Iss. 858, 2016-06 ,pp. : 505-508

Trans Tech Publications

Access to resources Recommend Favorite

Study of partial melting at high-pressure using in situ X-ray diffraction

By Andrault D.   Morard G.   Bolfan-Casanova N.   Ohtaka O.   Fukui H.   Arima H.   Guignot N.   Funakoshi K.   Lazor P.   Mezouar M.  

International Journal of High Pressure Research, Vol. 26, Iss. 3, 2006-09 ,pp. : 267-276

Taylor & Francis Ltd

Access to resources Recommend Favorite