Effect of silicon addition on microstructure and mechanical property of titanium nitride film prepared by plasma-assisted chemical vapor deposition

Author: Park B.H.   Kim Y.-I.   Kim K.H.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.348, Iss.1, 1999-07, pp. : 210-214

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract