Control of film orientation: a parametric study of laser ablated FTO films on a-, c- and r-cut sapphire substrates by X-ray diffraction

Author： Dai Z. Miyashita A. Yamamoto S. Narumi K. Naramoto H.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.349, Iss.1, 1999-07, pp. : 51-55

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