![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Battaglin C. Caccavale F. Menelle A. Montecchi M. Nichelatti E. Nicoletti F. Polato P.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.351, Iss.1, 1999-08, pp. : 176-179
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
AFM and XPS study of nitrided TiO 2 and SiO 2 -TiO 2 sol-gel derived films
By Wicikowski L. Kusz B. Murawski L. Szaniawska K. Susla B.
Vacuum, Vol. 54, Iss. 1, 1999-07 ,pp. :