X-Ray diffraction studies of p-CdS:Cu thin films

By Kashiwaba Y.   Komatsu T.   Nishikawa M.   Ishikawa Y.   Segawa K.   Hayasi Y.  

Thin Solid Films, Vol. 408, Iss. 1, 2002-04 ,pp. : 43-50

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Correlation of Raman and X-ray diffraction measurements of annealed pulsed laser deposited ZnO thin films

By Roy C.   Byrne S.   McGlynn E.   Mosnier J.-P.   de Posada E.   O'Mahony D.   Lunney J.G.   Henry M.O.   Ryan B.   Cafolla A.A.  

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Substrate influence on the X-ray diffraction patterns of amorphous chalcogenide thin films deposited on silicon wafers

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High quality ZnS:Mn thin films grown by quasi-rheotaxy for electroluminescent devices

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Kinetics of the energy transfer between copper and two kinds of manganese centres in thin ZnS:Mn films

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