Studies of amorphous carbon using X-ray photoelectron spectroscopy, near-edge X-ray-absorption fine structure and Raman spectroscopy

Author： Ramm M. Ata M. Brzezinka K.-W. Gross T. Unger W.

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.354, Iss.1, 1999-10, pp. : 106-110

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