Structural investigation of SiC epitaxial layers grown under microgravity and on-ground conditions

Author: Pecz B.   Yakimova R.   Syvajarvi M.   Lockowandt C.   Radamson H.   Radnoczi G.   Janzen E.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.357, Iss.2, 1999-12, pp. : 137-143

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract