Investigation of annealing effects on indium tin oxide thin films by electron energy loss spectroscopy

Author: Zhu F.   Huan C.H.A.   Zhang K.   Wee A.T.S.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.359, Iss.2, 2000-01, pp. : 244-250

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Abstract