X-ray excited optical luminescence (XEOL): a potential tool for OELD studies

Author： Sham T.K.   Sammynaiken R.   Zhu Y.J.   Zhang P.   Coulthard I.   Naftel S.J.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.363, Iss.1, 2000-03, pp. : 318-321

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