Erratum to ''Surface roughness of oxidized copper films studied by atomic force microscopy and spectroscopic light scattering'' [Thin Solid Films 325 (1998) 92-98]

Author： Ronnow D.   Lindstrom T.   Isidorsson J.   Ribbing C.-G.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.366, Iss.1, 2000-05, pp. : 306-306

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