Influence of Mn content in MBE-grown Sn 1-x Mn x Te layers on their structural properties studied by X-ray diffraction

Author： Diduszko R.   Domuchowski V.   Nadolny A.J.   Sadowski J.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.367, Iss.1, 2000-05, pp. : 168-170

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