Raman characterization of epitaxial Cu-In-Se thin films

Author: Ely J.H.   Ohno T.R.   Furtak T.E.   Nelson A.J.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.371, Iss.1, 2000-08, pp. : 36-39

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract