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Taylor & Francis Ltd

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Retrieved optical properties of thin films on absorbing substrates from transmittance measurements by application of a spectral projected gradient method

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Thin Solid Films, Vol. 425, Iss. 1, 2003-02 ,pp. : 1-8

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Simple method for determining the optical constants of thin metallic films from transmittance measurements

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Use of artificial neural networks to predict thickness and optical constants of thin films from reflectance data

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Determination of optical constants and average thickness of inhomogeneous-rough thin films using spectral dependence of optical transmittance

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