The effects of growth temperature on the microstructure and electrical barrier height in PtSi/p-Si(100) Schottky barrier detector

Author: Horng G.-J.   Chang C.-Y.   Ho C.   Lee C.-Y.   Huang T.Y.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.374, Iss.1, 2000-10, pp. : 80-84

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Abstract