Angle dependence of transmission probability of incident electrons into thin oxide films and noise spectra

Author: Obara K.   Muroya K.   Eguchi K.-i.   Panli Y.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.375, Iss.1, 2000-10, pp. : 275-279

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Abstract