Characterisation of CuInS 2 /ZnSe junctions by XPS and electroreflectance

Author： Chaparro A.M.   Maffiotte C.   Gutierrez M.T.   Herrero J.   Klaer J.   Siemer K.   Braunig D.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.387, Iss.1, 2001-05, pp. : 104-107

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