Author: Eberspacher C. Fredric C. Pauls and Jack Serra K.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.387, Iss.1, 2001-05, pp. : 18-22
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Annealing effects of anodized Al-based alloy for thin-film transistors
Thin Solid Films, Vol. 318, Iss. 1, 1998-04 ,pp. :
Vacuum pressure thermal thin-film sensor
By Berlicki T.M. Osadnik S.J. Prociow E.L.
Vacuum, Vol. 53, Iss. 3, 1999-06 ,pp. :
Thin Solid Films, Vol. 368, Iss. 1, 2000-06 ,pp. :