SIMS characterisation of chemical solution deposited thin film systems of BaTiO 3 /X (X=LaNiO 3 , La 0.5 Sr 0.5 CoO 3 , La 0.7 Sr 0.3 MnO 3 ) on a platinised silicon wafer

Author： Pollak C.   Busic A.   Reichmann K.   Hutter H.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.405, Iss.1, 2002-02, pp. : 218-223

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