Thin films: stress, strain and structure-property relations

Author: Yeadon M.   Kaiyang Z.   Huey Hoon H.   Twesten R.D.   Abothu R.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.424, Iss.1, 2003-01, pp. : 1-1

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Abstract