Thickness dependent electrical resistivity of ultrathin (<40 nm) Cu films

By Liu H.-D.   Zhao Y.-P.   Ramanath G.   Murarka S.P.   Wang G.-C.  

Thin Solid Films, Vol. 384, Iss. 1, 2001-03 ,pp. : 151-156

Elsevier

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Pd-induced effects in the electronic structure of thin Cu and Au films

By Wronkowska A.A.   Wronkowski A.   Arwin H.  

Vacuum, Vol. 54, Iss. 1, 1999-07 ,pp. : 167-172

Elsevier

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Change in electrical resistivity during continuous heating of Cu 3 Pd alloys quenched from various temperatures

By Mitsui Kazuhiro  

Philosophical Magazine B, Vol. 81, Iss. 4, 2001-04 ,pp. : 433-449

Taylor & Francis Ltd

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Changes in electrical resistivity during isothermal annealing of thermally disordered Cu–15at.%Pd alloys

By Mitsui K.  

Philosophical Magazine Letters, Vol. 82, Iss. 4, 2002-04 ,pp. : 225-233

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A continuous electrical resistivity measurement in thin films

By Cvelbar A.   Panjan P.   Navinsek B.   Budnar M.   Zalar A.   Trontelj L.  

Thin Solid Films, Vol. 270, Iss. 1, 1995-12 ,pp. : 367-370

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