![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Matsui Y. Nakamura Y. Shimamoto Y. Hiratani M.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.437, Iss.1, 2003-08, pp. : 51-56
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Image force effects on trapezoidal barrier parameters in metal-insulator-metal tunnel junctions
By Ma X.C. Shu Q.Q. Meng S. Ma W.G.
Thin Solid Films, Vol. 436, Iss. 2, 2003-07 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Identification of multiphoton induced photocurrents in metal–insulator–metal junctions
By Diesing D.
Applied Physics B, Vol. 78, Iss. 3-4, 2004-02 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Evidence for field emission in electroformed metal-insulator-metal devices
Thin Solid Films, Vol. 288, Iss. 1, 1996-11 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)