STM and photoelectron spectroscopy studies of silicon-cerium dioxide interface formation

Author： Rad M.G.   Hirschauer B.   Gothelid M.   Karlsson U.O.  

Publisher： Elsevier

ISSN： 0042-207X

Source： Vacuum, Vol.49, Iss.3, 1998-03, pp. : 175-179

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