Author: Stoycheva-Topalova R. Assa J. Buroff A. Tzvetkov T. Necheva S. Drandarov N. Vichev R.
Publisher: Elsevier
ISSN: 0042-207X
Source: Vacuum, Vol.51, Iss.2, 1998-10, pp. : 273-275
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Ga + ion irradiated a-As 2 S 3 layers
By Stoycheva-Topalova R. Assa J. Buroff A. Tzvetkov T. Necheva S. Drandarov N.
Vacuum, Vol. 58, Iss. 2, 2000-08 ,pp. :
Ar + and He + -ion influence on Si 2p and O 1s atomic lines: An XPS study
By Benkherourou O. Deville J.P.
Vacuum, Vol. 49, Iss. 2, 1998-02 ,pp. :
PAC and CEMS study of ion-irradiated Ag/Fe and In/Fe layers
By Neubauer M. Lieb K.P. Schaaf P. Uhrmacher M.
Thin Solid Films, Vol. 275, Iss. 1, 1996-04 ,pp. :