Temporization of a scanning ion gun for the in-depth measurement of the erosion rate compatible with SIMS data acquisition: A recursive method

By Serrano J.J.   Blanco J.M.   Aguilar M.   Ameziane O.  

Vacuum, Vol. 48, Iss. 7, 1997-09 ,pp. : 643-645

Elsevier

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Comparison of depth profiling techniques using ion sputtering from the practical point of view

By Oswald S.   Baunack S.  

Thin Solid Films, Vol. 425, Iss. 1, 2003-02 ,pp. : 9-19

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The effects of ion bombardment sputtering and atomic transport related roughening and smoothing on depth profiling resolution

By Carter G.  

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Application of directional AES for nondestructive depth profile analysis of an Au-Cu alloy

By Mroz S.   Mroz A.  

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The freon flooding technique in SIMS analysis

By Sielanko J.   Filiks J.   Sowa M.   Zinkiewicz J.   Drewniak M.  

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