Characterization of silicon films deposited in presence of nitrogen plasma

Author: Patil S.J.   Bodas D.S.   Ethiraj A.S.   Purandare R.C.   Phatak G.J.   Kulkarni S.K.   Gangal S.A.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.65, Iss.1, 2002-02, pp. : 91-100

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Abstract