Investigation of radiation-induced defects in the electron irradiated power transistor structures

Author： Korshunov F.P.   Bogatyrev Y.V.   Lastovsky S.B.   Kulgachev V.I.   Anufriev L.P.   Rubtsevich I.I.   Golubev N.F.  

Publisher： Elsevier

ISSN： 0042-207X

Source： Vacuum, Vol.70, Iss.2, 2003-03, pp. : 197-200

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