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Ultramicroscopy, Vol. 71, Iss. 1, 1998-03 ,pp. : 361-370

Elsevier

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Reconstruction of the dielectric contrast profile from near-field data

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Numerical analysis of a two-dimensional near-field probe

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Investigations on field-ion image formation and field evaporation sequences of DO 3 -ordered Fe 3 Al

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Analysis of fiber probes of scanning near-field optical microscope by field emission microscopy

By Sekatskii S.K.   Mironov B.N.   Lapshin D.A.   Dietler G.   Letokhov V.S.  

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